IEEE

Deep Reinforcement Learning-Based Automatic Test Pattern Generation

Abstract: Automatic test pattern generation (ATPG) is a key technology in digital circuit testing. In this paper, we propose an ATPG method based on deep reinforcement learning (DRL), aiming to reduce ...
GitHub

This example project is a reference implementation to showcase a number of best practices ...

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IEEE

Test Patterns Compression Technique Based on a Dedicated SAT-Based ATPG

Abstract: In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method is targeted to ...