Abstract: In automatic test pattern generation (ATPG), SAT-based methods are typically used to complement structural approaches, especially for addressing hard-to-detect faults. However, as the size ...

As semiconductor applications in automotive, data center, and high-performance computing grow increasingly mission-critical, the industry faces mounting pressure to achieve near-perfect manufacturing ...

Here is a fork of ABC containing Agdmap, a novel technology mapper for LUT-based FPGAs. Agdmap is based on a technology mapping algorithm with adaptive gate decomposition [1]. It is a cut enumeration ...

The complexity of system-on-chip (SoC) designs continues to grow, so the corresponding design-for-test (DFT) logic required for manufacturing has become more advanced. Design teams are challenged by ...

Digital integrated circuits typically use asynchronous set/resets to set the value of memory elements (flip-flops) without depending on any clock pulses. This logic, however, requires special handling ...