Abstract: Automatic test pattern generation (ATPG) is a key technology in digital circuit testing. In this paper, we propose an ATPG method based on deep reinforcement learning (DRL), aiming to reduce ...

Abstract: Automatic Test Pattern Generation (ATPG) is a crucial technology in the testing of digital circuits. The excessive backtracks during the ATPG process can consume considerable computational ...

Part of the SD Times 100 2026 series. See the full SD Times 100 2026 list for every category and honoree. Software testing ...

America’s World Cup test: Can a new generation finally rewrite the USMNT’s history of early exits? - Getting to the knockout ...

Materials scientists at Rice University have developed a new workflow methodology for measuring microscopic defects in ...

AI agents are now taking over repetitive work, identifying issues humans may miss, and helping teams maintain testing speed ...

New research provides evidence that while advanced artificial intelligence models process language with remarkable skill, ...

Most earbuds play music and cancel noise. AirPods Pro 3 also monitor your heart rate, translate languages in real time, and ...

Qatar has become the place where FIFA experiments with the next generation of football technology. The results are already ...

The future of semiconductor test may depend as much on data movement and workflow intelligence as on the tester hardware ...

New KushoAI Research paper argues that AI-native testing needs to move beyond faster test generation toward coverage judgment, execution feedback, and continuous maintenance. SAN ...