On-Chip Debugging for Manufacturing and Test Simplifies, Shortens, and Improves Device Debugging Processes ALAMEDA, Calif.-- July 18, 2007--Wind River Systems, Inc. (NASDAQ: WIND), the global leader ...

Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

Application programming interface management company Kong Inc. is expanding support for autonomous artificial intelligence agents with the latest release of Insomnia, its open-source API development ...

Mozilla is testing a new feature in Firefox called Time Travel Debugging. The feature is aimed at developers and is currently only available in the latest version of Firefox Nightly for Mac. The new ...

Part two explains the workings of the JTAG boundary-scan technology. Part four explains how to use breakpoints, event triggers, and program traces to debug code. Emulation is a technology used in the ...

Imagine a world without a global notion of time. Now try to find out the flight direction of an airplane with the following information: There's an e-mail from Alice that she saw the plane about two ...

Part four explains how to use breakpoints, event triggers, and program traces to debug code. Part six reviews the common bugs found in DSP applications, and outlines the different testing methods ...

Part 5 of a six-part article: The easiest way to test the encryption is to send an e-mail to the e-mail administrator of the domain you just configured and ask him/her to send you back the headers of ...